Nelson, Wayne <br/><br/>
Accelerated testing :  statistical models, test plans and data analyses 
/by Wayne Nelson 
 - New York :  Wiley,  c1990 
 - xiv, 601 p. 
 - Wiley Series in Probability and Statistics .
 - Wiley Series in Probability and Statistics .
<br/><br/><label>ISBN: </label>978047169367 
<br/><br/><label>LCCN: </label>98710 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Análisis numérico.<br/>Estadística matemática.<br/>Ingeniería.<br/>Métodos estadísticos.
<br/><br/><label>Dewey Class. No.: </label>519.5  / N33