Accelerated testing : statistical models, test plans and data analyses /by Wayne Nelson
Material type:
TextSeries: Wiley Series in Probability and Statistics | Wiley Series in Probability and StatisticsPublication details: New York : Wiley, c1990Description: xiv, 601 pISBN: - 978047169367
- 519.5 N33
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Libro | Biblioteca Central Planta alta - Colección General | General | 519.5 N33 (Browse shelf(Opens below)) | Available (Préstamo 15 días) | 33724002176264 |
BATCH-UPD 10 20130110 UCH01 1106
BATCH-UPD 10 20130410 UCH01 0658
BATCH-UPD 10 20130914 UCH01 0349
CONVERSION 10 20130109 UCH01 1355
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