000 01124nam a22003257a 4500
003 CHAP
005 20220329143533.0
008 100420s1998 us a r 00010 spa d
010 _a98193
011 _a99165
020 _a0471143286
035 _a109850
040 _cCHAP
082 0 4 _a620.00452
_bM47
100 1 _aMeeker, William Q.
_974152
245 1 0 _aStatistical methods for reliability data
_c/by William Q. Meeker, Luis A. Escobar
260 _aNew York, NY :
_bWiley,
_cc1998
300 _axxii, 680 p. :
_bilus., gráfs., tablas
490 0 _aWiley Series in Probability and Statistics
590 _aBATCH-UPD
_b10
_c20130110
_lUCH01
_h1220
590 _aBATCH-UPD
_b10
_c20130410
_lUCH01
_h0755
590 _aBATCH-UPD
_b10
_c20130914
_lUCH01
_h1319
590 _aCONVERSION
_b10
_c20130109
_lUCH01
_h1354
650 0 4 _aIngeniería
_xMétodos estadísticos.
_958191
700 1 _aEscobar, Luis A.
_937530
830 0 _aWiley Series in Probability and Statistics
_9121945
901 _aBK
942 _cLIBRO
949 _a620.00452 M47
_bBC
_cLIBRO
_d33724002167421
_eLIBRO
_gI.250374
_h112331
_i109850
_sb
_t$2,102.55
999 _c98193
_d98193