000 01165cam a22003497a 4500
003 CHAP
005 20220329143555.0
008 100615s1990 nyu r 00010 eng d
010 _a98710
011 _a99682
020 _a978047169367
035 _a110368
040 _cCHAP
082 0 4 _a519.5
_bN33
100 1 _aNelson, Wayne
_980804
245 1 0 _aAccelerated testing :
_bstatistical models, test plans and data analyses
_c/by Wayne Nelson
260 _aNew York :
_bWiley,
_cc1990
300 _axiv, 601 p.
490 0 _aWiley Series in Probability and Statistics
590 _aBATCH-UPD
_b10
_c20130110
_lUCH01
_h1106
590 _aBATCH-UPD
_b10
_c20130410
_lUCH01
_h0658
590 _aBATCH-UPD
_b10
_c20130914
_lUCH01
_h0349
590 _aCONVERSION
_b10
_c20130109
_lUCH01
_h1355
650 1 4 _aAnálisis numérico.
_95991
650 1 4 _aEstadística matemática.
_938261
650 1 4 _aIngeniería.
_958173
650 1 4 _aMétodos estadísticos.
_976631
830 0 _aWiley Series in Probability and Statistics
_9121945
901 _aBK
942 _cLIBRO
949 _a519.5 N33
_bBC
_cLIBRO
_d33724002176264
_eLIBRO
_gI.250389
_h112803
_i110368
_si
_t$1532.98
999 _c98710
_d98710